(S)TEM – (Scanning-) Transmission Electron Microscopy
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Transmission electron microscopy is used to irradiate, image, diffract and analyze solids with electrons.
This method is particularly suitable for imaging crystal defects and finest structures down to atomic resolution and elemental analysis with EDX and EELS.
Applications
- Imaging and analysis of ultrafine particles ( > 1 nm)
- Mapping and analysis of crystal defects such as dislocations, stacking faults, grain and subgrain boundaries
- Structure of phase interfaces, especially thin films and multiphase structures
- Proof of crystallinity, crystal structure and crystal orientation
- Chemical composition of phases and phase mixtures with a local resolution of a few nanometers
Application Notes
NOx emission control: UNDERSTANDING PERFORMANCE REQUIRES INSIGHTS AT THE NANOMETER LEVEL
JEOL – JEM F200
|
Electron emitter |
Schottky Field Emission |
|
Accelerating voltage |
200 kV (80 kV) |
|
Point resolution |
0,23 nm |
|
Line resolution |
0.1 nm |
|
DF-STEM resolution |
0.14 nm |
|
Energy resolution |
≤ 0,8 eV |
|
Tilt range |
α / β max ± 80° (Tomo) / max. ± 31° |
|
EDX-System |
OXFORD AZtecEnergy TEM Advanced EDX 100mm² |
You can see an interactive 360 degree view of the TEM Jeol-JEM F200 here
FEI – Tecnai G² F20 S-TWIN
|
Electron emitter |
Schottky Field Emission |
|
Accelerating voltage |
200 kV |
|
Point resolution |
0,24 nm |
|
Information Limit |
0.15 nm |
|
STEM resolution |
0.2 nm |
|
Post-column GATAN energy filter Energy resolution |
0,7 eV |
|
Tilt range |
α / β ± 70° (Tomo) / ± 25° |
|
EDX-System |
EDAX |
Zeiss Libra 200 FE
|
Electron emitter |
Schottky Field Emission |
|
Accelerating voltage |
200 kV |
|
Point resolution |
0,29 nm |
|
Information Limit |
0.19 nm |
|
STEM resolution |
0.45 nm |
|
In-column Corrected OMEGA filter Energy resolution |
≤ 0,7 eV |
|
Tilt range |
α / β ± 70° / ± 30° |
|
EDX-System |
BRUKER AXS QUANTAX XFlash 5030 |
Analytical and Imaging Methods
|
Analytical and imaging methods |
JEOL JEM F200 |
FEI Tecnai F20 |
Zeiss LIBRA 200 FE |
|---|---|---|---|
|
TEM Bright-field Imaging |
× |
× |
× |
|
TEM Dark-field Imaging |
× |
× |
× |
|
High-resolution TEM - HRTEM |
× |
× |
× |
|
Selected Area Electron Diffraction - SAED |
× |
× |
× |
|
EDX point analysis |
× |
× |
× |
|
EDX line profile |
× |
× |
× |
|
Electron Energy-loss Spectroscopy - EELS |
|
× |
× |
|
Energy-filtering TEM / Electron Spectroscopic Imaging - ESI |
|
× |
× |
|
STEM Bright-field imaging |
× |
× |
× |
|
STEM Annular dark-field imaging - ADF |
× |
× |
× |
|
Nano-beam Electron Diffraction - NBED |
× |
× |
|
|
Convergent Beam Electron Diffraction - CBED |
× |
× |
× |