Large Chamber SEM

  Copyright: © A. Herwartz  

The large chamber SEM: large chamber for dynamic experiments.

Areas of application:

• Non-destructive examination of large objects with scanning electron microscopy (SEM) and microanalysis (EDX).
• Cyclic examination of components before and after different operating stages
• Variable pressure examination option
• In-situ testing with dedicated test equipment:
  • Bending test with optional heating option up to 800°C
  • Heating module for a temperature range up to 1500°C
  • in-situ machining device with the possibility to observe deformation of sheared surface and chip formation
    

You can find more information in our flyers:

Flyer-Use of the Large Chamber SEM

Flyer-Insitu devices LCSEM

 

You can find an interactive 360 degree view here