Who we areCopyright: © GFE
Founded in 1969 at RWTH Aachen University, ihe Central Facility for Electron Microscopy - GFE for short - is a central scientific unit that offers electron beam techniques for micro- and nanoanalytical material characterization.
For this purpose, the GFE operates two electron microprobes - EPMA, three scanning electron microscopes - SEM, one large chamber scanning microscope, one atomic force microscope - AFM and three transmission electron microscopes - TEM. Furthermore, the GFE offers state-of-the-art sample preparation techniques, such as focused ion beam machining – FIB. In order to guarantee high quality analytical results, sample preparation and characterization of the investigated materials are carried out by our high qualified staff with many years of experience and high scientific expertise in their area.
According to the RWTH Aachen University guidelines, all costs for characterization services are charged. Our division managers will be pleased to provide you with more detailed information on this and on the used analytical techniques. For general inquiries please contact the head of the GFE, Univ.-Prof. Dr. J. Mayer.