Used Techniques
 
 
Service
 
ERC
 

TEM - Transmission Electron Microscopy

Contact: Priv.-Doz. Dr.rer.nat. Thomas E. Weirich
e-mail: weirich@gfe.rwth-aachen.de
phone: +49-241-80-24349


With the aid of transmission electron microscopy solids are transmitted, imaged, diffracted and analysed by electrons. This method is especially suitable for the imaging of crystalline defects and very fine structures up to atomic resolution > 0.2 nm and with minimum mass fraction > 0.2 atom%.


Applications

 

Special methods: